1. 负责确保3D NAND集成电路从产品可行性阶段到量产阶段的可测性与可生产性
2. 开发,评估,解决与实施复杂的程序测试
3. 最新技术节点的新产品开发导入到量产开发,测试与评估新测试硬件解决方案
4. 组建与发展晶元可靠性(WLR)与晶元级高温工作寿命(WLH)测试组
5. 领导及与全球多个分部多个部门共同开发实施晶圆级可靠性与晶圆级高温工作寿命测试程序
6. 领导全球工作组协调工作流程,测试方案与测试方法
7. 领导及与全球利益相关者共同执行重要战略测试相关项目
8. 美光半导体(西安)有限责任公司
Responsible for ensuring the testability and manufacturability of integrated circuits from the component
feasibility stage through production ramp.
Build and develop the Wafer Level Reliability and Wafer Level HTOL probe team.
Development, evaluation, debug, and implementation of complex test programs.
Follow up latest technology node from NPI to HVM.
Design, development, testing, and qualification of new test hardware solutions.
Tester platform conversion, test infrastructure coding, pattern conversion and correlation
Leading and collaborating with cross-site and cross-functional teams to develop and implement complex
test solutions.
Leading and collaborating world-wide working groups to align business processes, test
programs, and methodologies.